[PDF.46oj] ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/TC 202/SC 4
[PDF.pw41] ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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| #9937587 in Books | 2007-08-23 | 10.50 x.6 x8.25l, | File type: PDF | 24 pages|
ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
You can specify the type of files you want, for your gadget.ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification | ISO/TC 202/SC 4. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.